IEEE

Impact of Strain on Sub-3 nm Gate-All-Around CMOS Logic Circuit Performance Using a Neural Compact Modeling Approach

Abstract: Impact of strain of sub-3 nm gate-all-around (GAA) CMOS transistors on the circuit performance is evaluated using a neural compact model. The model was trained using 3D technology ...

Encoding adaptive intelligence in molecular matter by design

For more than 50 years, scientists have sought alternatives to silicon for building molecular electronics. The vision was ...
IEEE

BAM-Net: Hardware Friendly Associative Memory Using Binary Dominant Weights and NAND Logic

Abstract: This paper presents BAM-Net, a hardware-efficient binarization algorithm designed for associative memory (AM) implementation. BAM-Net aims to reduce memory overhead, power consumption, and ...